DocumentCode :
972233
Title :
Field dependence of mobility in Al0.2Ga0.8As/GaAs heterojunctions at very low fields
Author :
Drummond, T.J. ; Keever, M. ; Kopp, W. ; Morko¿¿, H. ; Hess, K. ; Streetman, B.G. ; Cho, Andrew Y.
Author_Institution :
University of Illinois, Department of Electrical Engineering, Coordinated Science Laboratory, Urbana, USA
Volume :
17
Issue :
15
fYear :
1981
Firstpage :
545
Lastpage :
547
Abstract :
Multiple-period (Al, Ga)As/GaAs modulation doped heterojunction structures have been grown with molecular beam epitaxy. Electron mobilities of about 200 000 cm2/Vs at 10 K and 90000 cm2/Vs at 77 K with associated sheet carrier concentrations of about 2×1012 cm¿2 have been observed. The current parallel to the interfaces for low electric fields was examined as a function of lattice temperature. The electron mobility has been observed to be strongly dependent on the strength of the electric field, and hot electron effects were observable at a field as low as 10 V/cm. To our knowledge this is the first report of hot electron phenomena in GaAs at such small fields.
Keywords :
III-V semiconductors; aluminium compounds; carrier mobility; gallium arsenide; hot carriers; p-n heterojunctions; Al0.2Ga0.8As-GaAs heterojunction; electron mobility; field dependence; hot electron effects; lattice temperature; low electric fields; modulation doped heterojunction structures; molecular beam epitaxy; sheet carrier concentrations;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19810381
Filename :
4245855
Link To Document :
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