DocumentCode :
972244
Title :
Influence of channel doping-profile on camel-gate field effect transistors
Author :
Lour, Wen-Shiung ; Tsai, Jung-Hui ; Laih, Lih-Wen ; Liu, Wen-Chau
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Ocean Univ., Taiwan
Volume :
43
Issue :
6
fYear :
1996
fDate :
6/1/1996 12:00:00 AM
Firstpage :
871
Lastpage :
876
Abstract :
We report the performance of GaAs camel-gate FETs and its dependence on device parameters. In particular, the performance dependence on the doping-profile of a channel was investigated. In this study, one-step, bi-step, and tri-step doping channels with the same doping-thickness product are employed in camel-gate FETs, while keeping other parameters unchanged, For a one-step doping channel FET, theoretical analysis reveals that a high doping channel would provide a large transconductance which is suitable for logic applications. Decreasing the channel concentration increases the drain current and the barrier height. For a tri-step doping channel FET, it is found that the output drain current and the barrier height remain large and the relatively voltage-independent transconductance is also increased. These are the requirements for the large input signal power amplifiers. A fabricated camel-gate FET with a tri-step doping channel exhibits a large drain current density larger than 750 mA/mm and a potential barrier greater than 1.0 V. Furthermore, the relatively voltage-independent transconductance is as high as 220 mS/mm and the applied gate voltage is up to +1.5 V. A 1.5×100 μm2 device is found to have a ft of 30 GHz with a very low input capacitance
Keywords :
III-V semiconductors; capacitance; characteristics measurement; doping profiles; field effect transistors; gallium arsenide; semiconductor device models; semiconductor doping; 1.5 V; 30 GHz; GaAs; barrier height; camel-gate field effect transistors; channel concentration; channel doping-profile; doping-thickness product; drain current; input capacitance; output drain current; potential barrier; transconductance; Capacitance; Doping profiles; FETs; Gallium arsenide; Logic; MESFETs; Millimeter wave technology; Semiconductor diodes; Transconductance; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.502117
Filename :
502117
Link To Document :
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