DocumentCode
972528
Title
Concurrent error detection in array dividers by alternating input data
Author
Wey, C.-L.
Author_Institution
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Volume
139
Issue
2
fYear
1992
fDate
3/1/1992 12:00:00 AM
Firstpage
123
Lastpage
130
Abstract
Concurrent error detection (CED) schemes utilising time redundancy can keep chip area and interconnect to a minimum. An efficient time redundancy scheme, RESO, for array dividers has been reported. Under the same cell fault model, an alternated time redundancy CED scheme using alternating logic (AL) approach is proposed. Two array dividers are considered: nonrestoring array divider (NRD) and restoring array divider (RSD). The key to the detection of faults using AL approach is determining that at least one input combination exists for which the error does not result in alternating outputs. Results of this study show that the proposed design achieves the same CED capability as RESO implementation with a lower area overhead. Owing to the simplicity, low area overhead, and the cell fault model, the proposed AL approach will be very attractive to the design of fault-tolerant VLSI-based system.
Keywords
circuit reliability; dividing circuits; error detection; logic arrays; logic testing; redundancy; RESO; alternating logic; array dividers; cell fault model; chip area; concurrent error detection; fault-tolerant VLSI-based system; lower area overhead; nonrestoring array divider; restoring array divider; time redundancy;
fLanguage
English
Journal_Title
Computers and Digital Techniques, IEE Proceedings E
Publisher
iet
ISSN
0143-7062
Type
jour
Filename
129250
Link To Document