DocumentCode :
972544
Title :
Accelerating the pace of R&D in Asia
Author :
Yamada, Tomoaki
Volume :
12
Issue :
3
fYear :
1995
Firstpage :
12
Keywords :
Acceleration; Asia; Circuit faults; Circuit testing; Design automation; Life estimation; Logic testing; Research and development; Sequential circuits; Very large scale integration;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1995.466366
Filename :
466366
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=972544
