DocumentCode :
972615
Title :
Impact of amplified spontaneous emission on carrier density for measurement of optical nonlinearities in GaAs/AlGaAs multiple quantum wells
Author :
Kawase, M. ; Garmire, E. ; Lee, H.C. ; Dapkus, P.D.
Author_Institution :
Center for Laser Studies, Univ. of Southern California, Los Angeles, CA, USA
Volume :
29
Issue :
8
fYear :
1993
fDate :
8/1/1993 12:00:00 AM
Firstpage :
2306
Lastpage :
2312
Abstract :
It is shown that amplified spontaneous emission (ASE) can affect the measurement of nonlinear optical properties in semiconductors through its reduction of the excess carrier density. When the optical excitation area is large, lateral ASE can reduce the carriers within a much shorter period of time than the normal carrier lifetime. Just after ASE is over, the time-integrated surface photoluminescence signal may be used as a measure of the carrier density, which is the carrier density experienced by an ns probe in ps pump experiments. When the excited carrier density is at 1020 cm-3, surface ASE is also possible and is observed, even with small spot sizes
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; high-speed optical techniques; luminescence of inorganic solids; nonlinear optics; optical pumping; photoluminescence; semiconductor quantum wells; superradiance; GaAs-AlGaAs; MQW; SQW; amplified spontaneous emission; carrier density; carrier lifetime; excited carrier density; multiple quantum wells; ns probe; optical excitation area; optical nonlinearities; ps pump experiments; semiconductor quantum wells; semiconductors; small spot sizes; surface ASE; time-integrated surface photoluminescence signal; Charge carrier density; Density measurement; Gallium arsenide; Nonlinear optics; Optical pumping; Optical saturation; Quantum well devices; Semiconductor optical amplifiers; Spontaneous emission; Stimulated emission;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.245559
Filename :
245559
Link To Document :
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