DocumentCode
972656
Title
Identifying untestable faults in sequential circuits
Author
Liang, Hsing-Chung ; Lee, Chunglen ; Chen, Jwu E.
Volume
12
Issue
3
fYear
1995
Firstpage
14
Lastpage
23
Keywords
Circuit faults; Circuit simulation; Circuit testing; Controllability; Electrical fault detection; Fault detection; Fault diagnosis; Feedback circuits; Sequential analysis; Sequential circuits;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1995.466367
Filename
466367
Link To Document