DocumentCode :
972833
Title :
Behavior Investigations of Superconducting Fault Current Limiters in Power Systems
Author :
Ye, Lin ; Campbell, Archie
Author_Institution :
Dept. of Electr. Power Syst., China Agric. Univ., Beijing
Volume :
16
Issue :
2
fYear :
2006
fDate :
6/1/2006 12:00:00 AM
Firstpage :
662
Lastpage :
665
Abstract :
When electric power systems are interconnected in operation, the fault current levels increase. This problem can be solved by deploying a bus-tie Superconducting Fault Current Limiter (SFCL) in distribution substations which allows two buses to be tied without significantly raising fault current levels. The Alternative Transient Program (ATP) version of Electromagnetic Transient Program (EMTP), ATPDraw and The Output Processor (TOP) are applied to investigate the operational behavior of the SFCL in a parallel connection of radial supply systems. The case study showed that an SFCL on bus tie location can not only suppress the fault current levels effectively but also improve the power quality and the reliability of the supply network. The simulation results will be presented and discussed in detail
Keywords :
EMTP; fault current limiters; power distribution reliability; power supply quality; power system interconnection; power system simulation; substations; superconducting devices; ATPDraw; EMTP; alternative transient program; distribution substation; electromagnetic transient program; interconnection; power quality; power supply reliability; power system; radial supply system; superconducting fault current limiter; EMTP; Electromagnetic transients; Fault current limiters; Fault currents; Power quality; Power system faults; Power system interconnection; Power system reliability; Power system transients; Substations; Alternative transient program (ATP); bus tie location; electric power systems; electromagnetic transient program (EMTP); operational behavior; superconducting fault current limiter (SFCL);
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2006.870526
Filename :
1642935
Link To Document :
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