DocumentCode
972875
Title
Design and test in Taiwan
Volume
12
Issue
3
fYear
1995
Firstpage
22
Keywords
Circuit faults; Circuit testing; Educational institutions; Electrical fault detection; Fault detection; Fault diagnosis; Flip-flops; Production; Software tools; Test pattern generators;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1995.466369
Filename
466369
Link To Document