Title :
Concurrent error detection using monitoring machines
Author :
Parekhji, Rubin A. ; Venkatesh, G. ; Sherlekar, Sunil D.
Keywords :
Circuit faults; Circuit testing; Computerized monitoring; Condition monitoring; Delay; Electrical fault detection; Fault detection; Hardware; Logic testing; Sequential circuits;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.1995.466370
