Title :
Unloaded quality factor measurement for MIC dielectric resonator applications
Author :
Podcameni, A. ; Conrado, L.F.M. ; Mosso, M.M.
Author_Institution :
CETUC-Universidade Catolica, Rio de Janeiro, Brazil
Abstract :
The unloaded quality factor of a dielectric resonator, in the MIC environment, and magnetically coupled to a terminated microstrip line, is estimated by using a network analyser. It is sufficient to compute the relative bandwidth of the interception between the reflection coefficient locus and the R ¿ 1 = ±jX arcs.
Keywords :
Q-factor measurement; dielectric devices; microwave integrated circuits; network analysers; resonators; MIC dielectric resonator; magnetic coupling; network analyser; terminated microstrip line; unloaded quality factor measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19810459
