DocumentCode
973133
Title
Design and test in India
Volume
12
Issue
3
fYear
1995
Firstpage
28
Keywords
Automatic testing; Circuit faults; Circuit synthesis; Circuit testing; Condition monitoring; Delay; Design methodology; Electronic equipment testing; Sequential circuits; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1995.466371
Filename
466371
Link To Document