DocumentCode :
973133
Title :
Design and test in India
Volume :
12
Issue :
3
fYear :
1995
Firstpage :
28
Keywords :
Automatic testing; Circuit faults; Circuit synthesis; Circuit testing; Condition monitoring; Delay; Design methodology; Electronic equipment testing; Sequential circuits; System testing;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1995.466371
Filename :
466371
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=973133
