• DocumentCode
    973135
  • Title

    On the effectiveness of residue code checking for parallel two´s complement multipliers

  • Author

    Sparmann, U. ; Reddy, Sudhakar M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
  • Volume
    4
  • Issue
    2
  • fYear
    1996
  • fDate
    6/1/1996 12:00:00 AM
  • Firstpage
    227
  • Lastpage
    239
  • Abstract
    The effectiveness of residue code checking for online error detection in parallel two´s complement multipliers has only up until now been evaluated experimentally for few architectures. In this paper a formal analysis is given for most of the current multiplication schemes. Based on this analysis it is shown which check bases are appropriate, and how the original scheme has to be extended for complete error detection at the input registers and Booth recoding circuitry. In addition, we argue that the hardware overhead for checking can be reduced by approximately one half if a small latency in error detection is acceptable. Schemes for structuring the checking logic in order to guarantee it to be self-testing, and thus achieve the totally self-checking goal for the overall circuit, are also derived.
  • Keywords
    VLSI; arithmetic codes; automatic testing; built-in self test; digital arithmetic; error analysis; error detection; error detection codes; integrated circuit testing; integrated logic circuits; logic testing; multiplying circuits; parallel processing; Booth recoding circuitry; check bases; error detection; formal analysis; hardware overhead reduction; input registers; multiplication schemes; online error detection; parallel two´s complement multipliers; residue code checking; self-testing; totally self-checking; Built-in self-test; Circuits; Cities and towns; Computer errors; Encoding; Hardware; Parallel algorithms; Rails; Registers; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.502194
  • Filename
    502194