DocumentCode :
973152
Title :
Theory of Junction Diode and Junction Transistor Noise
Author :
van der Ziel, A. ; Becking, A.G.T.
Author_Institution :
Elec. Eng. Dept., Univ. of Minnesota, Minneapolis, Minn.
Volume :
46
Issue :
3
fYear :
1958
fDate :
3/1/1958 12:00:00 AM
Firstpage :
589
Lastpage :
594
Abstract :
A. van der Ziel has given formulas for shot noise in junction diodes and junction transistors for transistors in which: 1) All current is carried by one type of carrier. 2) The carrier flow is one-dimensional. 3) The recombination is by volume recombination. These equations are here proved with the help of a corpuscular approach without any significant restrictions except that the individual holes can be treated as independent. The emitter and collector currents are then split into various parts for which the noise spectrum can be obtained by relatively simple reasoning.
Keywords :
Broadcasting; Contact resistance; Integrated circuit noise; Noise generators; Noise level; Noise measurement; Radiative recombination; Semiconductor device noise; Semiconductor diodes; Thermal resistance;
fLanguage :
English
Journal_Title :
Proceedings of the IRE
Publisher :
ieee
ISSN :
0096-8390
Type :
jour
DOI :
10.1109/JRPROC.1958.286873
Filename :
4065363
Link To Document :
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