DocumentCode
973152
Title
Theory of Junction Diode and Junction Transistor Noise
Author
van der Ziel, A. ; Becking, A.G.T.
Author_Institution
Elec. Eng. Dept., Univ. of Minnesota, Minneapolis, Minn.
Volume
46
Issue
3
fYear
1958
fDate
3/1/1958 12:00:00 AM
Firstpage
589
Lastpage
594
Abstract
A. van der Ziel has given formulas for shot noise in junction diodes and junction transistors for transistors in which: 1) All current is carried by one type of carrier. 2) The carrier flow is one-dimensional. 3) The recombination is by volume recombination. These equations are here proved with the help of a corpuscular approach without any significant restrictions except that the individual holes can be treated as independent. The emitter and collector currents are then split into various parts for which the noise spectrum can be obtained by relatively simple reasoning.
Keywords
Broadcasting; Contact resistance; Integrated circuit noise; Noise generators; Noise level; Noise measurement; Radiative recombination; Semiconductor device noise; Semiconductor diodes; Thermal resistance;
fLanguage
English
Journal_Title
Proceedings of the IRE
Publisher
ieee
ISSN
0096-8390
Type
jour
DOI
10.1109/JRPROC.1958.286873
Filename
4065363
Link To Document