• DocumentCode
    973152
  • Title

    Theory of Junction Diode and Junction Transistor Noise

  • Author

    van der Ziel, A. ; Becking, A.G.T.

  • Author_Institution
    Elec. Eng. Dept., Univ. of Minnesota, Minneapolis, Minn.
  • Volume
    46
  • Issue
    3
  • fYear
    1958
  • fDate
    3/1/1958 12:00:00 AM
  • Firstpage
    589
  • Lastpage
    594
  • Abstract
    A. van der Ziel has given formulas for shot noise in junction diodes and junction transistors for transistors in which: 1) All current is carried by one type of carrier. 2) The carrier flow is one-dimensional. 3) The recombination is by volume recombination. These equations are here proved with the help of a corpuscular approach without any significant restrictions except that the individual holes can be treated as independent. The emitter and collector currents are then split into various parts for which the noise spectrum can be obtained by relatively simple reasoning.
  • Keywords
    Broadcasting; Contact resistance; Integrated circuit noise; Noise generators; Noise level; Noise measurement; Radiative recombination; Semiconductor device noise; Semiconductor diodes; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IRE
  • Publisher
    ieee
  • ISSN
    0096-8390
  • Type

    jour

  • DOI
    10.1109/JRPROC.1958.286873
  • Filename
    4065363