DocumentCode :
973365
Title :
Fault diagnosis in Japan
Volume :
12
Issue :
3
fYear :
1995
Firstpage :
45
Keywords :
Analytical models; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Dictionaries; Fault diagnosis; Large scale integration; Logic; System testing;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1995.466376
Filename :
466376
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=973365
