DocumentCode
973365
Title
Fault diagnosis in Japan
Volume
12
Issue
3
fYear
1995
Firstpage
45
Keywords
Analytical models; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Dictionaries; Fault diagnosis; Large scale integration; Logic; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1995.466376
Filename
466376
Link To Document