DocumentCode

973386

Title

Value deduction algorithm

Volume

12

Issue

3

fYear

1995

Firstpage

48

Keywords

Circuit faults; Circuit testing; Fault diagnosis;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/MDT.1995.466378

Filename

466378