• DocumentCode
    973416
  • Title

    Total observability

  • Volume
    12
  • Issue
    3
  • fYear
    1995
  • Firstpage
    54
  • Keywords
    CMOS integrated circuits; CMOS logic circuits; Circuit faults; Circuit testing; Current measurement; Instruments; Integrated circuit testing; Observability; Production; Test pattern generators;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1995.466380
  • Filename
    466380
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=973416