DocumentCode :
973416
Title :
Total observability
Volume :
12
Issue :
3
fYear :
1995
Firstpage :
54
Keywords :
CMOS integrated circuits; CMOS logic circuits; Circuit faults; Circuit testing; Current measurement; Instruments; Integrated circuit testing; Observability; Production; Test pattern generators;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1995.466380
Filename :
466380
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=973416
