DocumentCode
973524
Title
Achieving I/sub DDQ/I/sub SSQ/ production testing with QuiC-
Author
Wallquist, Kenneth M.
Volume
12
Issue
3
fYear
1995
Firstpage
62
Keywords
Circuit testing; Current measurement; Measurement units; Monitoring; Phasor measurement units; Production; Switches; Time measurement; Velocity measurement; Voltage measurement;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1995.466382
Filename
466382
Link To Document