DocumentCode :
973524
Title :
Achieving I/sub DDQ/I/sub SSQ/ production testing with QuiC-
Author :
Wallquist, Kenneth M.
Volume :
12
Issue :
3
fYear :
1995
Firstpage :
62
Keywords :
Circuit testing; Current measurement; Measurement units; Monitoring; Phasor measurement units; Production; Switches; Time measurement; Velocity measurement; Voltage measurement;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1995.466382
Filename :
466382
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=973524
