• DocumentCode
    973638
  • Title

    Full-wave analysis of coplanar waveguide discontinuities using the frequency domain TLM method

  • Author

    Jin, Hang ; Vahldieck, Rüdiger

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Victoria Univ., BC, Canada
  • Volume
    41
  • Issue
    9
  • fYear
    1993
  • fDate
    9/1/1993 12:00:00 AM
  • Firstpage
    1538
  • Lastpage
    1542
  • Abstract
    This paper presents a full-wave analysis of a variety of coplanar waveguide discontinuities using the frequency domain TLM method. The finite metallization thickness is taken into account as well as metal losses and the interaction of fundamental and higher order modes between cascaded discontinuities. Numerical results are presented for the frequency-dependent s-parameters of transitions between CPW and slotline, CPW and microstrip line and CPW-microstrip overlap transition. The effect of interactions between the CPW discontinuities and the CPW airbridges is also investigated
  • Keywords
    S-parameters; frequency-domain analysis; metallisation; microstrip components; waveguide couplers; waveguide theory; CPW airbridges; CPW-microstrip line transition; CPW-microstrip overlap transition; CPW-slotline transition; cascaded discontinuity mode interactions; coplanar waveguide discontinuities; finite metallization thickness; frequency domain TLM method; frequency-dependent s-parameters; full-wave analysis; metal losses; numerical results; Circuits; Coplanar waveguides; Electromagnetic waveguides; Frequency domain analysis; Metallization; Microstrip; Scattering parameters; Slotline; Transmission line discontinuities; Waveguide discontinuities;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.245674
  • Filename
    245674