مرکز منطقه ای اطلاع رساني علوم و فناوري - IRE Standards on Solid-State Devices: Methods of Testing Point-Contact Transistors for Large-Signal Applications, 1958

DocumentCode :

973669

Title :

IRE Standards on Solid-State Devices: Methods of Testing Point-Contact Transistors for Large-Signal Applications, 1958

Volume :

Issue :

fYear :

1958

fDate :

5/1/1958 12:00:00 AM

Firstpage :

878

Lastpage :

888

Keywords :

Measurement standards; Personnel; Piecewise linear approximation; Power amplifiers; Pulse amplifiers; Semiconductor device testing; Semiconductor devices; Solid state circuits; Switches; Transistors;

fLanguage :

English

Journal_Title :

Proceedings of the IRE

Publisher :

ieee

ISSN :

0096-8390

Type :

jour

DOI :

10.1109/JRPROC.1958.286941

Filename :

4065411

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=973669