DocumentCode
973669
Title
IRE Standards on Solid-State Devices: Methods of Testing Point-Contact Transistors for Large-Signal Applications, 1958
Volume
46
Issue
5
fYear
1958
fDate
5/1/1958 12:00:00 AM
Firstpage
878
Lastpage
888
Keywords
Measurement standards; Personnel; Piecewise linear approximation; Power amplifiers; Pulse amplifiers; Semiconductor device testing; Semiconductor devices; Solid state circuits; Switches; Transistors;
fLanguage
English
Journal_Title
Proceedings of the IRE
Publisher
ieee
ISSN
0096-8390
Type
jour
DOI
10.1109/JRPROC.1958.286941
Filename
4065411
Link To Document