DocumentCode :
973853
Title :
Industrial BIST of embedded RAMs
Author :
Camurati, P. ; Prinetto, Paolo ; Reorda, Matteo Sonza ; Barbagallo, Stefano ; Burri, A. ; Medina, Davide
Volume :
12
Issue :
3
fYear :
1995
Firstpage :
86
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Hardware; Libraries; Performance evaluation; Pins; Random access memory; Read only memory; Read-write memory;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1995.466385
Filename :
466385
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=973853
