DocumentCode
973853
Title
Industrial BIST of embedded RAMs
Author
Camurati, P. ; Prinetto, Paolo ; Reorda, Matteo Sonza ; Barbagallo, Stefano ; Burri, A. ; Medina, Davide
Volume
12
Issue
3
fYear
1995
Firstpage
86
Keywords
Automatic testing; Built-in self-test; Circuit faults; Hardware; Libraries; Performance evaluation; Pins; Random access memory; Read only memory; Read-write memory;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1995.466385
Filename
466385
Link To Document