DocumentCode
973907
Title
Deformation and I
Degradation Behavior in Bent Bi-2223 Tapes Under Pressurized Liquid Nitrogen
Author
Shin, Hyung-Seop ; Dizon, John Ryan C ; Choi, Ho-Yeon ; Kim, Seokho ; Ha, Dong-Woo ; Oh, Sang-Soo
Author_Institution
Sch. of Mech. Eng., Andong Nat. Univ., Kyungbuk
Volume
16
Issue
2
fYear
2006
fDate
6/1/2006 12:00:00 AM
Firstpage
1051
Lastpage
1054
Abstract
The Ic degradation behaviors of Bi-2223 superconducting tapes under pressurized liquid nitrogen were investigated using a newly developed sample holder which gives a series of bending strains to a sample. Four kinds of commercially available multifilamentary Bi-2223 superconducting tapes were used. At atmospheric pressure, the Ic degradation behavior depended upon the reinforcement adopted, the tapes externally reinforced or densified by over pressure showed better bending strain tolerance than the Ag alloy-sheathed Bi-2223 tapes. But these tapes showed a larger Ic degradation when pressurized to 1 MPa in liquid nitrogen. For all samples, after depressurization to atmospheric pressure from 1 MPa, the Ic was completely recovered to its initial values at atmospheric pressure. When the samples were warmed up to room temperature after being depressurized from 1 MPa, ballooning occurred at some parts of some samples. It was found that the larger degradation of Ic occurred at the regions where significant ballooning occurred
Keywords
barium compounds; bending strength; calcium compounds; critical current density (superconductivity); high-temperature superconductors; lead compounds; multifilamentary superconductors; strontium compounds; superconducting tapes; 1 MPa; Ag alloy-sheathed Bi-2223 tapes; Bi2-xPbxSr2Ca2Cu 3O10; Ic degradation; atmospheric pressure; bending strain tolerance; bent multifilamentary Bi-2223 superconducting tapes; critical current; deformation; densification; depressurization; pressurized liquid nitrogen; Bismuth compounds; Capacitive sensors; Critical current; Degradation; High temperature superconductors; Magnetic field induced strain; Nitrogen; Strain measurement; Superconducting films; Testing; Bending strain; Bi-2223 tapes; critical current; pressurized;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2005.864324
Filename
1643029
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