DocumentCode :
973973
Title :
Derivation of P/sub 3F/
Volume :
12
Issue :
3
fYear :
1995
Firstpage :
92
Keywords :
Built-in self-test; Condition monitoring; Decoding; Gain measurement; Integrated circuit testing; Logic testing; Performance gain; Protocols; Tagging;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1995.466386
Filename :
466386
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=973973
