DocumentCode
973973
Title
Derivation of P/sub 3F/
Volume
12
Issue
3
fYear
1995
Firstpage
92
Keywords
Built-in self-test; Condition monitoring; Decoding; Gain measurement; Integrated circuit testing; Logic testing; Performance gain; Protocols; Tagging;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1995.466386
Filename
466386
Link To Document