Title :
Liquid phase epitaxial growth and properties of spinel thin films
Author :
Robertson, J.M. ; Damen, J. P M ; Algra, E.A. ; Robertson, John ; Damen, J. ; Algra, H.
Author_Institution :
Philips Research Laboratories, Eindhoven, The Netherlands
fDate :
11/1/1979 12:00:00 AM
Abstract :
We have studied the quality of liquid phase epitaxially grown spinel ferrite layers using optical microscopy, secondary ion mass spectroscopy, X-ray diffraction and spin wave resonance. The films were grown from PbOB2O3, Na2B4O7and Pb2P2O7fluxes on different substrates. We have found that if the layers are grown from a PbOB2O3flux it is necessary to have a misorientation of a few degrees from the
Keywords :
Epitaxial growth; Ferrites; Mass spectroscopy; Optical diffraction; Optical films; Optical microscopy; Particle beam optics; Resonance; Transistors; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1979.1060526
