DocumentCode :
974011
Title :
Outdiffusion as a Technique for the Production of Diodes and Transistors
Author :
Halpern, J. ; Rediker, R.H.
Author_Institution :
Lincoln Laboratory, M.I.T., Lexington, Mass.
Volume :
46
Issue :
6
fYear :
1958
fDate :
6/1/1958 12:00:00 AM
Firstpage :
1068
Lastpage :
1076
Abstract :
The outdiffusion process, which consists of the extraction of impurities from a semiconductor wafer by heating it to an elevated temperature in a high vacuum, is shown to be a practical method for the production of diodes and transistors. The usefulness of outdiffusion as a technique for device fabrication depends on how easily impurities can be evaporated from the crystal surface. The surface-evaporation velocity K which characterizes the ease of removal of impurities has been determined for the evaporation of antimony out of germanium at 700°C and is (1.5±0.5)×10-8 cm/sec. This value is large enough to indicate that it is definitely feasible to make high-frequency devices by outdiffusion. Narrow base germanium computer diodes have been fabricated that have a forward drop of 0.11 volt at 1 ma and that switch at speeds up to 5 mc. The operation of these graded base diodes is analyzed. Germanium n-p-n graded base transistors have also been fabricated which have grounded-emitter current gains, ß, of over 100 and alpha frequency cutoffs, f¿co, of above 200 mc.
Keywords :
Fabrication; Forward contracts; Germanium; Heating; P-n junctions; Production; Semiconductor diodes; Semiconductor impurities; Semiconductor materials; Switches;
fLanguage :
English
Journal_Title :
Proceedings of the IRE
Publisher :
ieee
ISSN :
0096-8390
Type :
jour
DOI :
10.1109/JRPROC.1958.286845
Filename :
4065446
Link To Document :
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