Title :
Measurement of Transistor Thermal Resistance
Author_Institution :
U. S. Army Signal Eng. Labs., Ft. Monmouth, N.J.
fDate :
6/1/1958 12:00:00 AM
Abstract :
A method of measuring the thermal resistance of transistors using the collector cutoff current as an indicator is described. The author uses a series of two steps to determine the overall junction-to-ambient thermal resistance. This type of arrangement is most accurate and less time consuming than the one-step over-all junction-to-ambient measurement.
Keywords :
Current measurement; Electrical resistance measurement; Germanium; Power measurement; Power transistors; Silicon; Temperature; Thermal resistance; Time measurement; Voltage;
Journal_Title :
Proceedings of the IRE
DOI :
10.1109/JRPROC.1958.286903
