DocumentCode :
974246
Title :
Current and Temperature Dependent Characteristics of Deep-Ultraviolet Light-Emitting Diodes
Author :
Cao, X.A. ; LeBoeuf, S.F.
Author_Institution :
West Virginia Univ., Morgantown
Volume :
54
Issue :
12
fYear :
2007
Firstpage :
3414
Lastpage :
3417
Abstract :
The electrical and optical characteristics of the 340-and 280-nm AlGaN-based deep-ultraviolet multiple-quantum-well light-emitting diodes (LEDs) at low temperatures (5-300 K) and various injection currents were studied. The negligible blue shift of the peak energy with increasing current density and monotonic blue shift with decreasing temperature suggest the absence of localized state emission. In the 340-nm LED, a band-tail state emission centered at 353 nm was dominated at low currents around 150 K, whereas the 280-nm LED exhibited minimal defect emission over the entire temperature range. The internal quantum efficiencies of both LEDs at room temperature were found to be less than 5%, indicating that there is significant room for improvement in structure design and material quality.
Keywords :
III-V semiconductors; aluminium compounds; electroluminescent devices; gallium compounds; light emitting diodes; quantum well devices; spectral line shift; tunnelling; ultraviolet sources; AlGaN - Interface; band-tail state emission; current dependent characteristics; deep-ultraviolet light-emitting diodes; injection currents; material quality; monotonic blue shift; multiple-quantum-well light-emitting diodes; quantum efficiencies; structure design; temperature 5 K to 300 K; temperature dependent characteristics; wavelength 280 nm; wavelength 340 nm; wavelength 353 nm; Aluminum gallium nitride; Biomedical optical imaging; Current measurement; Design optimization; Electronic packaging thermal management; Epitaxial growth; Light emitting diodes; Quantum well devices; Temperature dependence; Thermal resistance; Carrier tunneling; electroluminescence (EL); light-emitting diode (LED); localization effects;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2007.908532
Filename :
4383016
Link To Document :
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