DocumentCode :
974584
Title :
Effect of energy relaxation on injected current pulse in high-frequency IMPATT diodes
Author :
Lippens, Didier ; Constant, Eric
Author_Institution :
Université de Lille I, Centre Hyperfréquences et Semiconducteurs, LA CNRS 287, Villeneuve d´Ascq, France
Volume :
17
Issue :
23
fYear :
1981
Firstpage :
878
Lastpage :
879
Abstract :
The effect of energy relaxation on carrier injection in millimetre-wave IMPATT diodes is considered. For this purpose, an approximate formula relating the current pulse injected in the transit region, including the energy relaxation, is derived. Its influence on the RF impedance of the impatt oscillator is discussed.
Keywords :
IMPATT diodes; carrier mobility; impact ionisation; IMPATT oscillator; RF impedance; carrier injection; energy relaxation; high-frequency IMPATT diodes; injected current pulse; microwave devices;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19810612
Filename :
4246094
Link To Document :
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