• DocumentCode
    974645
  • Title

    Magnetic properties of Fe/Ti multilayered films for a magnetic recording medium

  • Author

    Ono, Satoshi ; Nitta, Michio ; Naoe, Masahiko

  • Author_Institution
    Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
  • Volume
    25
  • Issue
    5
  • fYear
    1989
  • fDate
    9/1/1989 12:00:00 AM
  • Firstpage
    3872
  • Lastpage
    3874
  • Abstract
    Films with combinations of Fe and Ti layers of various thicknesses (dFe of 10~1000 Å and dTi of 10~200 Å) have been prepared at Ar gas pressure of 2 mtorr in an apparatus with two pairs of facing-target sputtering sources. The total thickness of the Fe layers was fixed at 1000 Å for all specimen films. The saturation magnetization 4πMs calculated from the expected total thickness of Fe layers decreased first gradually and then abruptly with dFe, becoming almost zero at dFe of about 15 Å for all as-deposited films. The coercive force, Hc, increased with decreasing dFe, taking a maximum value of 270 Oe at dFe of 20 Å, and decreased abruptly with further decrease of dFe. The films with modulation period of Fe(52 Å)/Ti(53 Å) which were annealed at temperatures above 200°C had smaller 4 πM than the as-deposited ones and Hc as high as 650 Oe at 230~325°C. Films with this modulation period annealed at about 250°C could be used as a magnetic recording medium because they have relatively large average 4πMs of 4 kG, H c of 650 Oe, moderate squareness of 0.7, and coercivity squareness of 0.8
  • Keywords
    coercive force; iron; magnetic recording; magnetic thin films; magnetisation; sputtered coatings; titanium; Fe-Ti multilayer films; coercive force; coercivity squareness; facing-target sputtering sources; magnetic recording medium; modulation period; saturation magnetisation; Annealing; Argon; Coercive force; Iron; Magnetic films; Magnetic modulators; Magnetic properties; Saturation magnetization; Sputtering; Temperature;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.42461
  • Filename
    42461