DocumentCode :
974663
Title :
Developing closer ties with worldwide standards organization
Author :
Hammons, T.J.
Volume :
13
Issue :
12
fYear :
1993
fDate :
12/1/1993 12:00:00 AM
Firstpage :
3
Keywords :
Face detection; Globalization; IEC standards; IEEE activities; Manufacturing industries; North America; Standards activities; Standards development; Standards organizations; Technological innovation;
fLanguage :
English
Journal_Title :
Power Engineering Review, IEEE
Publisher :
ieee
ISSN :
0272-1724
Type :
jour
DOI :
10.1109/MPER.1993.245806
Filename :
245806
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=974663