Title :
CCD linear image sensor with buried overflow drain structure
Author :
Goto, Hiromi ; Sekine, H. ; Yamada, Tomoaki ; Suzuki, Nobuhiro
Author_Institution :
Toshiba Corporation, Semiconductor Division, Kawasaki, Japan
Abstract :
A CCD linear image sensor with buried overflow drain structure has been developed. Since the overflow drain, i.e. a reverse biased n-region buried under photosites arrayed in p-layer, makes an effective sink of excess electrons, imaging characteristics such as uniformity of photosensitivity, spectral response, resolution, and antiblooming, are highly improved.
Keywords :
charge-coupled device circuits; image sensors; CCD linear image sensor; buried overflow drain structure; imaging characteristics; optoelectronic devices;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19810630