DocumentCode :
974767
Title :
CCD linear image sensor with buried overflow drain structure
Author :
Goto, Hiromi ; Sekine, H. ; Yamada, Tomoaki ; Suzuki, Nobuhiro
Author_Institution :
Toshiba Corporation, Semiconductor Division, Kawasaki, Japan
Volume :
17
Issue :
24
fYear :
1981
Firstpage :
904
Lastpage :
905
Abstract :
A CCD linear image sensor with buried overflow drain structure has been developed. Since the overflow drain, i.e. a reverse biased n-region buried under photosites arrayed in p-layer, makes an effective sink of excess electrons, imaging characteristics such as uniformity of photosensitivity, spectral response, resolution, and antiblooming, are highly improved.
Keywords :
charge-coupled device circuits; image sensors; CCD linear image sensor; buried overflow drain structure; imaging characteristics; optoelectronic devices;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19810630
Filename :
4246113
Link To Document :
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