• DocumentCode
    974769
  • Title

    Reliability analysis of interconnection networks using hierarchical composition

  • Author

    Blake, James T. ; Trivedi, Kishor S.

  • Author_Institution
    US Army Inst. for Res. in Manage. Inf., Commun. & Comput. Sci., Atlanta, GA, USA
  • Volume
    38
  • Issue
    1
  • fYear
    1989
  • fDate
    4/1/1989 12:00:00 AM
  • Firstpage
    111
  • Lastpage
    120
  • Abstract
    Based on the nature of the upper- and lower-bound block diagram models of multistage interconnection networks (MINs), a series system consisting of independent subsystems is considered. To model the reliability of such a system with online repair and imperfect coverage, the usual approach is to construct and solve a large, overall Markov model. A two-level hierarchical model is instead proposed in which each subsystem is modeled as a Markov chain and the system reliability is then modeled as a series system of independent Markov components. This technique is extended to compute the instantaneous availability of the system with imperfect coverage and online repair. Extensions to allow for transient faults and phase-type repair time distributions are straightforward. It should be possible to apply this approach to other fault-tolerant MINs and to any system that can be modeled as a series system where each subsystem has a parallel-redundant structure
  • Keywords
    Markov processes; multiprocessor interconnection networks; redundancy; reliability theory; Markov chain; Markov model; hierarchical composition; imperfect coverage; independent subsystems; instantaneous availability; interconnection networks; multistage interconnection networks; online repair; parallel-redundant structure; phase-type repair time distributions; series system; system reliability; transient faults; Availability; Bandwidth; Computer network reliability; Costs; Fault tolerance; Merging; Multiprocessing systems; Multiprocessor interconnection networks; Switches; Telecommunication network reliability;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.24584
  • Filename
    24584