DocumentCode :
974844
Title :
Recursive Bayesian Linear Regression for Adaptive Classification
Author :
Chien, Jen-Tzung ; Chen, Jung-Chun
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Cheng Kung Univ., Tainan
Volume :
57
Issue :
2
fYear :
2009
Firstpage :
565
Lastpage :
575
Abstract :
This paper presents a new recursive Bayesian linear regression (RBLR) algorithm for adaptive pattern classification. This algorithm performs machine learning in nonstationary environments. A classification model is adopted in model training. The initial model parameters are estimated by maximizing the likelihood function of training data. To activate the sequential learning capability, the randomness of the model parameters is properly expressed by the normal-gamma distribution. When new adaptation data are input, sufficient statistics are accumulated to obtain a new normal-gamma distribution as the posterior distribution. Accordingly, a recursive Bayesian algorithm is established to update the hyperparameters. The trajectory of nonstationary environments can be traced to perform the adaptive classification. Such recursive Bayesian models are used to satisfy the requirements of maximal class margin and minimal training error, which are essential in support vector machines (SVMs). In the experiments on the UCI machine learning repository and the FERET facial database, the proposed algorithm outperforms the state-of-art algorithms including SVMs and relevance vector machines (RVMs). The improvement is not only obtained in batch training but also in sequential adaptation. Face classification performance is continuously elevated by adapting to changing facial conditions.
Keywords :
Bayes methods; learning (artificial intelligence); pattern classification; recursive estimation; regression analysis; support vector machines; adaptive pattern classification; face classification; machine learning; maximal class margin; minimal training error; normal-gamma distribution; recursive Bayesian linear regression; relevance vector machines; sequential learning capability; support vector machines; Bayesian adaptation; face recognition; machine learning; sequential learning; support vector machine (SVM);
fLanguage :
English
Journal_Title :
Signal Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1053-587X
Type :
jour
DOI :
10.1109/TSP.2008.2008258
Filename :
4663936
Link To Document :
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