DocumentCode
974877
Title
Distributed Field Estimation With Randomly Deployed, Noisy, Binary Sensors
Author
Wang, Ye ; Ishwar, Prakash
Author_Institution
Dept. of Electr. & Comput. Eng., Boston Univ., Boston, MA
Volume
57
Issue
3
fYear
2009
fDate
3/1/2009 12:00:00 AM
Firstpage
1177
Lastpage
1189
Abstract
The reconstruction of a bounded deterministic field from binary-quantized observations of sensors which are randomly deployed over the field domain is studied. The sensor observations are corrupted by bounded additive noise. The study focuses on the extremes of lack of deterministic control in the sensor deployment, lack of knowledge of the noise distribution, and lack of sensing precision and reliability. Such adverse conditions are motivated by possible real-world scenarios where a large collection of low-cost, crudely manufactured sensors are mass-deployed in an environment where little can be assumed about the ambient noise. A simple estimator that reconstructs the entire field from these unreliable, binary-quantized, noisy observations is proposed. Technical conditions for the almost sure and mean squared error (MSE) convergence of the estimate to the field, as the number of sensors tends to infinity, are derived and their implications are discussed. For finite-dimensional, bounded-variation, and Sobolev-differentiable function classes, specific MSE decay rates are derived.
Keywords
distributed sensors; mean square error methods; Sobolev-differentiable function class; binary sensors; binary-quantized observations; bounded additive noise; bounded deterministic field; bounded-variation function class; distributed field estimation; finite-dimensional function class; mean squared error; noisy sensors; randomly deployed sensors; Almost sure convergence; Monte Carlo sampling; distributed source coding; dithered scalar quantization; minimax rate of convergence; non-parametric field regression; oversampled analog-to-digital conversion; scaling law; sensor networks;
fLanguage
English
Journal_Title
Signal Processing, IEEE Transactions on
Publisher
ieee
ISSN
1053-587X
Type
jour
DOI
10.1109/TSP.2008.2008535
Filename
4663939
Link To Document