DocumentCode :
974894
Title :
Work function characterization of electroactive materials using an EMOSFET
Author :
Van Anh, Dam Thi ; Olthuis, Wouter ; Bergveld, Piet
Author_Institution :
Lab-on-a-Chip Group, Univ. of Twente, Enschede, Netherlands
Volume :
4
Issue :
3
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
284
Lastpage :
287
Abstract :
Materials with redox properties have been widely used in sensing applications. Understanding the redox properties of these materials is an important issue. In order to investigate the redox properties, there are several methods, such as using the Kelvin probe and a conductivity sensor, or using other well-known electrochemical techniques. In this paper, we introduce another possibility to characterize redox materials by investigating their work function using an electrolyte metal-oxide semiconductor field effect transistor (EMOSFET) device, in which the studied redox material is applied as gate electrode. In the EMOSFET, the conductivity of the channel is modulated by the work function of the studied material. The change in the work function of a redox material due to electrically and chemically induced processes will be shown by an example of the EMOSFET having a potassium ferric ferrocyanide gate.
Keywords :
MOSFET; conducting materials; electrochemical sensors; electrolytes; oxidation; reduction (chemical); work function; EMOSFET; Kelvin probe; conductivity sensor; electroactive materials; electrochemical techniques; electrolyte metal-oxide semiconductor field effect transistor; gate electrode; potassium ferric ferrocyanide gate; redox material; redox properties; work function; Amperometric sensors; Conducting materials; Conductivity; Inorganic materials; Kelvin; MOS devices; MOSFET circuits; Probes; Semiconductor materials; Sensor phenomena and characterization; $^rm E$MOSFET; Electroactive material; electrolyte metal-oxide semiconductor field effect transistor; work function;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2004.827208
Filename :
1294906
Link To Document :
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