DocumentCode :
975439
Title :
Nonradiative regions in GaInAsP/InP double heterostructure laser material: correlation with dislocation clusters in the substrates
Author :
Elliott, C.R. ; Regnault, J.C. ; Wakefield, B.
Author_Institution :
British Telecom Research Laboratories, Ipswich, UK
Volume :
18
Issue :
1
fYear :
1982
Firstpage :
7
Lastpage :
8
Abstract :
The results of an examination of GaInAsP/InP laser material grown by liquid phase epitaxy using transmission cathodoluminescence, polarised infra-red microscopy and electrochemical etching techniques are reported. It is shown that dislocation clusters in the InP substrate give rise to non-radiative regions in the active layer.
Keywords :
III-V semiconductors; dislocations; gallium arsenide; indium compounds; semiconductor epitaxial layers; semiconductor junction lasers; GaInAsP-InP laser; InP substrate; active layer; dislocation clusters; double heterostructure laser; electrochemical etching; liquid phase epitaxy; nonradiative regions; polarised infrared microscopy; semiconductor laser; transmission cathodoluminescence;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19820006
Filename :
4246180
Link To Document :
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