Title :
Designing a Dependable and Fault-Tolerant Semiautonomous Distributed Control Data Collection Network With Opportunistic Hierarchy
Author :
Plankis, Brian J. ; Horning, Markus ; Ponto, Niko ; Brown, Lynda K.
Author_Institution :
Texas A&M Univ., Galveston
fDate :
4/1/2007 12:00:00 AM
Abstract :
This paper presents the satellite-linked data acquisition and photogrammetry (SLiDAP) network, designed to conduct shore-based, close-range 3-D imaging in remote areas. The lack of communications and power infrastructure and ability to service the system requires periodic, synchronous operations of multiple semiautonomous elements with a high degree of reliability. The SLiDAP system uses an opportunistic network architecture based on four distinct levels of control, to accommodate unpredictable operational constraints and failures. The synchronization of periodic tasks in a distributed control and remotely operable network are highlighted, and measures to increase the reliability of system operations are discussed, including hardware redundancy, intelligent watchdog timer, software error tolerance, self-repair, and remote update capability. The characteristics of the SLiDAP system within the concept of autonomic computing are discussed.
Keywords :
data acquisition; distributed control; fault tolerance; photogrammetry; remote sensing; satellite links; telecommunication control; telecommunication network reliability; SLiDAP; close-range 3D imaging; data collection network; fault-tolerant semiautonomous distributed control; hardware redundancy; intelligent watchdog timer; opportunistic hierarchy; opportunistic network architecture; remotely operable network; satellite-linked data acquisition and photogrammetry; software error tolerance; Communication system control; Computer architecture; Control systems; Data acquisition; Distributed control; Fault tolerance; Hardware; Power system reliability; Software measurement; Telecommunication network reliability; Autonomic computing; distributed networks; embedded system; fault tolerance; reliability;
Journal_Title :
Oceanic Engineering, IEEE Journal of
DOI :
10.1109/JOE.2006.880390