Title :
Experimental observation of asymmetric detuning characteristics in semiconductor laser injection locking
Author :
Kobayashi, Kaoru ; Nishimoto, H. ; Lang, Richard
Author_Institution :
Nippon Electric Co. Ltd., Opto-Electronics Research Laboratories, Kawasaki, Japan
Abstract :
The effects of refractive index dependence on the active region carrier density in semiconductor laser injection locking have been examined experimentally. Strong asymmetry has been observed in the relation between locked longitudinal mode intensity and the difference between an original longitudinal mode wavelength and the injecting light wavelength.
Keywords :
carrier density; laser mode locking; refractive index; semiconductor junction lasers; active region carrier density; asymmetric detuning characteristics; injecting light wavelength; locked longitudinal mode intensity; original longitudinal mode wavelength; refractive index dependence; semiconductor junction lasers; semiconductor laser injection locking;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19820038
