• DocumentCode
    976240
  • Title

    Stripe-geometry laser with in-situ ohmic contact and self-aligned native surface oxide mask for current isolation prepared by molecular beam epitaxy

  • Author

    Tsang, W.T. ; Logan, R.A. ; Ditzenberger, J.A.

  • Author_Institution
    Bell Laboratories, Murray Hill, USA
  • Volume
    18
  • Issue
    3
  • fYear
    1982
  • Firstpage
    123
  • Lastpage
    124
  • Abstract
    A simple stripe-geometry laser is prepared by molecular beam epitaxy with an in-situ ohmic contact stripe and self-aligned native surface oxide mask for current isolation. The thresholds are about 70 mA for 5 ¿m-wide and 380 ¿m-long stripes. The light/current characteristics are linear up to ¿8¿10 mW/mirror with a spontaneous emission level at threshold of ¿0.3 mW/mirror. The temperature coefficient T0 measured for one wafer is as high as 255 K.
  • Keywords
    masks; molecular beam epitaxial growth; ohmic contacts; semiconductor growth; semiconductor junction lasers; current isolation; light/current characteristics; molecular beam epitaxy; ohmic contact; self-aligned native surface oxide mask; stripe-geometry laser; thresholds;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19820082
  • Filename
    4246258