DocumentCode
976240
Title
Stripe-geometry laser with in-situ ohmic contact and self-aligned native surface oxide mask for current isolation prepared by molecular beam epitaxy
Author
Tsang, W.T. ; Logan, R.A. ; Ditzenberger, J.A.
Author_Institution
Bell Laboratories, Murray Hill, USA
Volume
18
Issue
3
fYear
1982
Firstpage
123
Lastpage
124
Abstract
A simple stripe-geometry laser is prepared by molecular beam epitaxy with an in-situ ohmic contact stripe and self-aligned native surface oxide mask for current isolation. The thresholds are about 70 mA for 5 ¿m-wide and 380 ¿m-long stripes. The light/current characteristics are linear up to ¿8¿10 mW/mirror with a spontaneous emission level at threshold of ¿0.3 mW/mirror. The temperature coefficient T0 measured for one wafer is as high as 255 K.
Keywords
masks; molecular beam epitaxial growth; ohmic contacts; semiconductor growth; semiconductor junction lasers; current isolation; light/current characteristics; molecular beam epitaxy; ohmic contact; self-aligned native surface oxide mask; stripe-geometry laser; thresholds;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19820082
Filename
4246258
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