DocumentCode :
976240
Title :
Stripe-geometry laser with in-situ ohmic contact and self-aligned native surface oxide mask for current isolation prepared by molecular beam epitaxy
Author :
Tsang, W.T. ; Logan, R.A. ; Ditzenberger, J.A.
Author_Institution :
Bell Laboratories, Murray Hill, USA
Volume :
18
Issue :
3
fYear :
1982
Firstpage :
123
Lastpage :
124
Abstract :
A simple stripe-geometry laser is prepared by molecular beam epitaxy with an in-situ ohmic contact stripe and self-aligned native surface oxide mask for current isolation. The thresholds are about 70 mA for 5 ¿m-wide and 380 ¿m-long stripes. The light/current characteristics are linear up to ¿8¿10 mW/mirror with a spontaneous emission level at threshold of ¿0.3 mW/mirror. The temperature coefficient T0 measured for one wafer is as high as 255 K.
Keywords :
masks; molecular beam epitaxial growth; ohmic contacts; semiconductor growth; semiconductor junction lasers; current isolation; light/current characteristics; molecular beam epitaxy; ohmic contact; self-aligned native surface oxide mask; stripe-geometry laser; thresholds;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19820082
Filename :
4246258
Link To Document :
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