DocumentCode :
976258
Title :
Scanning the issue
Author :
Allen, John
Author_Institution :
Massachusetts Institute of Technology, Cambridge, MA, USA
Volume :
73
Issue :
11
fYear :
1985
Firstpage :
1539
Lastpage :
1540
Abstract :
Provides an overview of the technical articles and features presented in this issue.
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1985.13338
Filename :
1457606
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=976258
