Title :
Automatic breakdown voltage measurement of polymer films
Author :
Xu, Chunchuan Charles ; Ho, Janet ; Boggs, Steven A.
Author_Institution :
Electr. Insulation Res. Center Univ. of Connecticut Storrs, Storrs, CT
Abstract :
Automatic breakdown tester for film samples which employs metalized film electrodes has been developed and demonstrated. Using this system, up to 600 breakdowns have been carried out automatically on capacitor film with a Weibull characteristic breakdown voltage in the range of 5 kV. Breakdown data measured with this system agree with data measured manually using the same test method. Measurements of breakdown field as a function of active area agree well with theory based on an assumed Weibull distribution for the breakdown field. A duplicate of this system has been delivered to the Army Research Laboratory, Adelphi, MD.
Keywords :
Weibull distribution; electric breakdown; polymer films; voltage measurement; Adelphi; Army Research Laboratory; Weibull characteristic; automatic breakdown voltage measurement; capacitor film; metalized film electrodes; polymer films; Area measurement; Automatic testing; Breakdown voltage; Capacitors; Electric breakdown; Electrodes; Polymer films; System testing; Voltage measurement; Weibull distribution; Breakdown strength, Weibull distribution, polymer films, measurement methods;
Journal_Title :
Electrical Insulation Magazine, IEEE
DOI :
10.1109/MEI.2008.4665348
