• DocumentCode
    976540
  • Title

    Automatic breakdown voltage measurement of polymer films

  • Author

    Xu, Chunchuan Charles ; Ho, Janet ; Boggs, Steven A.

  • Author_Institution
    Electr. Insulation Res. Center Univ. of Connecticut Storrs, Storrs, CT
  • Volume
    24
  • Issue
    6
  • fYear
    2008
  • Firstpage
    30
  • Lastpage
    34
  • Abstract
    Automatic breakdown tester for film samples which employs metalized film electrodes has been developed and demonstrated. Using this system, up to 600 breakdowns have been carried out automatically on capacitor film with a Weibull characteristic breakdown voltage in the range of 5 kV. Breakdown data measured with this system agree with data measured manually using the same test method. Measurements of breakdown field as a function of active area agree well with theory based on an assumed Weibull distribution for the breakdown field. A duplicate of this system has been delivered to the Army Research Laboratory, Adelphi, MD.
  • Keywords
    Weibull distribution; electric breakdown; polymer films; voltage measurement; Adelphi; Army Research Laboratory; Weibull characteristic; automatic breakdown voltage measurement; capacitor film; metalized film electrodes; polymer films; Area measurement; Automatic testing; Breakdown voltage; Capacitors; Electric breakdown; Electrodes; Polymer films; System testing; Voltage measurement; Weibull distribution; Breakdown strength, Weibull distribution, polymer films, measurement methods;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0883-7554
  • Type

    jour

  • DOI
    10.1109/MEI.2008.4665348
  • Filename
    4665348