DocumentCode
976576
Title
Technology assessment
Author
Pugh, Emerson W.
Author_Institution
IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA
Volume
73
Issue
12
fYear
1985
Firstpage
1756
Lastpage
1763
Abstract
An account is given of the evolution and use of the "minimum-linewidth method" for assessing competing integrated circuit technologies, beginning with its use in evaluating thin magnetic-film memory devices in the early 1960s and ending with its use in assessing Josephson-junction devices some twenty years later. From this account, general rules are derived for conducting successful technology assessments.
Keywords
Copper; Design optimization; Fabrication; Integrated circuit technology; Magnetic devices; Magnetic semiconductors; Magnetization; Proposals; Read-write memory; Uncertainty;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1985.13368
Filename
1457636
Link To Document