Title :
Technology assessment
Author :
Pugh, Emerson W.
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA
Abstract :
An account is given of the evolution and use of the "minimum-linewidth method" for assessing competing integrated circuit technologies, beginning with its use in evaluating thin magnetic-film memory devices in the early 1960s and ending with its use in assessing Josephson-junction devices some twenty years later. From this account, general rules are derived for conducting successful technology assessments.
Keywords :
Copper; Design optimization; Fabrication; Integrated circuit technology; Magnetic devices; Magnetic semiconductors; Magnetization; Proposals; Read-write memory; Uncertainty;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1985.13368
