A 68-ns 4-Mbit CMOS EPROM with high-noise-immunity design

Author

Imamiya, Kenichi ; Miyamoto, Junichi ; Atsumi, Shigeru ; Ohtsuka, Nobuaki ; Muroya, Yukinori ; Sako, Toshiyuki ; Higashino, Masao ; Iyama, Yumiko ; Mori, Seiichi ; Ohshima, Yoichi ; Araki, Hitoshi ; Kaneko, Yukio ; Narita, Kazuhito ; Arai, Norihisa ; Yosh

Author_Institution

Toshiba Corp., Kawasaki, Japan

Volume

25

Issue

1

fYear

1990

fDate

2/1/1990 12:00:00 AM

Firstpage

72

Lastpage

78

Abstract

In a VLSI memory, noise generated by its own operation is a serious problem. The noise disturbs data sensing, especially in EPROMs which have a single-ended sensing scheme. To develop high-density and high-speed EPROMs, it is necessary to solve the noise problems. Incorrect EPROM functions due to the noise are discussed. High-noise-immunity circuit techniques for stable data sensing and high-speed access time are proposed. These are divided bit-line layout, reference line with dummy bit lines, and a chip-enable transition detector. Using these circuit techniques and 0.8-μm n-well CMOS technology, a 512 K×8-b CMOS EPROM was developed. A 68-ns access time was achieved. The die size is 5.62 mm×15.30 mm, and it is assembled in a 600-mil cerdip package

Keywords

CMOS integrated circuits; EPROM; VLSI; integrated circuit technology; integrated memory circuits; 0.8 micron; 4 Mbit; 5.62 to 15.3 mm; 512 kbyte; 600 mil; 68 ns; CMOS EPROM; ULSI; VLSI memory; cerdip package; chip-enable transition detector; circuit techniques; die size; divided bit-line layout; high noise immunity circuit techniques; high-noise-immunity design; high-speed EPROMs; high-speed access time; megabit EPROM; n-well CMOS technology; reference line with dummy bit lines; single-ended sensing scheme; stable data sensing; submicron; CMOS technology; Circuit noise; EPROM; Noise generators; Noise level; Packaging; Parasitic capacitance; Semiconductor device noise; Very large scale integration; Voltage;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.50287

Filename

50287