DocumentCode :
976770
Title :
Measurement accuracy—RF to optical
Author :
Ambler, Ernest
Author_Institution :
National Bureau of Standards, Gaithersburg, MD, USA
Volume :
74
Issue :
1
fYear :
1986
Firstpage :
7
Lastpage :
8
Abstract :
Various developments in microwave and optical metrology that have been stimulated by the needs of satellite and optical fiber telecommunications are discussed. A few recent examples of the symbiosis of science, technology, and metrology in the microwave and optical fields are noted. Meeting the challenge of providing calibration support to the new automated measurement systems is seen to require a high degree of cooperation among government, industry, and the universities.
Keywords :
Artificial satellites; Calibration; Educational institutions; Government; Metrology; Microwave technology; Optical fiber communication; Optical fibers; Stimulated emission; Symbiosis;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1986.13389
Filename :
1457657
Link To Document :
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