Spectrally-filtered electroluminescence of vertical-cavity surface-emitting lasers

Author

Herrick, Robert W. ; Cheng, Y. Michael ; Petroff, Pierre M. ; Hibbs-Brenner, Mary K. ; Morgan, Robert A.

Author_Institution

Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA

Volume

7

Issue

10

fYear

1995

Firstpage

1107

Lastpage

1109

Abstract

We show that spontaneous emission from the mirror layers (/spl lambda/=780 nm) of a vertical cavity surface emitting laser (VCSEL) is a significant component of the spectrum. By using bandpass filters, we are able to distinguish the electroluminescence (or "near-field") pattern of the mirror layers from the active region pattern. We show that in some lasers, these patterns are irregular, possibly due to the presence of absorbing doping or defect clusters in the p-mirror that absorb light from the active region, and re-radiate the light at the shorter wavelength characteristic of the mirror layers. In addition, we show that dark areas appear, both in the active regions and the mirrors, as the device degrades.<>

Keywords

III-V semiconductors; aluminium compounds; band-pass filters; cathodoluminescence; electroluminescence; gallium arsenide; laser mirrors; laser reliability; optical filters; quantum well lasers; semiconductor device reliability; spontaneous emission; surface emitting lasers; 780 nm; DBR mirror stacks; GaAs quantum wells; GaAs-Al/sub 0.25/Ga/sub 0.75/As; VCSEL; absorbing doping clusters; active region pattern; bandpass filters; cathodoluminescence spectrum; dark areas; defect clusters; degradation mechanism; mirror layers; near-field pattern; p-mirror; radiative recombination; spectrally-filtered electroluminescence; spontaneous emission; vertical-cavity surface-emitting lasers; Degradation; Doping; Electroluminescence; Failure analysis; Fiber lasers; Mirrors; Optical coupling; Spontaneous emission; Surface emitting lasers; Vertical cavity surface emitting lasers;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.466558

Filename

466558