Title :
Self-consistent particle modeling of inductively coupled CF/sub 4/ discharges and radical flow
Author :
Takekida, Hideto ; Nanbu, Kenichi
Author_Institution :
Inst. of Fluid Sci., Tohoku Univ., Sendai
fDate :
6/1/2006 12:00:00 AM
Abstract :
The structures of axisymmetrical inductively coupled CF4 plasmas were examined by the use of the particle-in-cell/Monte Carlo method. The effects of gas pressure and power deposition on the structure of plasmas were examined for 2-10 mtorr and 200-600 W. The electron density increased with the power and pressure, while the electron temperature increased with power deposition and decreased with increasing pressure. The latter resulted in an increase in plasma potential. The density of CF3 + ion, which is the dominant positive species, slightly changed with gas pressure. The density of other positive species also weakly depended on the gas pressure and power. The dominant negative ion was F-. Its density was about half of the electron density. The electron energy distribution was near the Maxwellian distribution. Flows of CF4 and other CFx radicals were examined by the use of the direct simulation Monte Carlo method. The production rate of CFx radicals, which was derived from the plasma simulation, was employed as the input data in the flow simulation. The spatial distributions of pressure, density, temperature, and flow velocity were obtained. CF4 density increased with pressure and decreased with increasing power. The densities of other CFx radicals were almost one order smaller than the density of CF4 and weakly depended on the pressure and power. At a low gas pressure, however, the density of the radicals became comparable to that of CF4 density. These results are in a qualitative agreement with previous measurements and the results of the global model
Keywords :
Monte Carlo methods; discharges (electric); organic compounds; plasma density; plasma flow; plasma simulation; plasma sources; plasma temperature; 2 to 10 mtorr; 200 to 600 W; Maxwellian distribution; Monte Carlo method; electron density; electron energy distribution; electron temperature; flow simulation; gas pressure; inductively coupled discharges; ion density; particle-in-cell method; plasma potential; plasma simulation; plasma structure; power deposition; radical flow; Electrons; Etching; Monte Carlo methods; Plasma applications; Plasma chemistry; Plasma density; Plasma materials processing; Plasma measurements; Plasma simulation; Plasma temperature; Carbon tetrafluoride; inductively coupled plasma; particle-in-cell/Monte Carlo (PIC/MC) simulation;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2006.875730