• DocumentCode
    977518
  • Title

    Amdahl´s law: a generalization under processor failures

  • Author

    Önyüksel, Ibrahim ; Hosseini, Seyed Hossein

  • Author_Institution
    Dept. of Comput. Sci., Northern Illinois Univ., DeKalb, IL, USA
  • Volume
    44
  • Issue
    3
  • fYear
    1995
  • fDate
    9/1/1995 12:00:00 AM
  • Firstpage
    455
  • Lastpage
    462
  • Abstract
    Recent advances in VLSI technology make it possible to manufacture computer systems with thousands of processors that can work concurrently on the same problem and improve the running time of programs. Amdahl´s law measures the speedup (the ratio of the running time of a program on a 1-processor system to the running time of the same program on a multi-processor system) under the assumptions that processors are fault free and do not fail. This paper generalizes Amdahl´s law under the assumption that processors are subject to failures. If the failure of processors is modeled as random, the actual number of processors available to a program becomes a random variable as well. This stochastic process is represented by a closed queuing network, and it is completely analyzed under certain assumptions. Numerical results show that value of the degradation factor (the ratio of failure rate of processors to their repair rate) is crucial to the system performance. Amdahl´s law implicitly uses the fact that all of the processors are used by the parallel portion of a program. However, for a real system, processors are subject to failure, and consequently, the number of available processors becomes random. This paper assumes that processors may fail and re-evaluates the expression for the speedup factor in Amdahl´s law. It obtains closed-form expressions for the speedup factor and the PLF (performance loss factor)
  • Keywords
    fault tolerant computing; parallel architectures; parallel programming; performance evaluation; queueing theory; reliability; stochastic processes; Amdahl´s law; VLSI; closed queuing network; closed-form expressions; computer systems manufacture; degradation factor; fault free; multiprocessor system; numerical results; performance loss factor; processor failure; repair rate; speedup; stochastic process; system performance; Computer aided manufacturing; Concurrent computing; Degradation; Manufacturing processes; Queueing analysis; Random variables; Stochastic processes; Time measurement; Velocity measurement; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.406581
  • Filename
    406581