• DocumentCode
    977627
  • Title

    iDD pulse response testing: a unified approach to testing digital and analogue ICs

  • Author

    Beasley, J. ; Ramamurthy, H. ; Ramirez-Angulo, Jaime

  • Author_Institution
    Dept. of Electr. & Comput. Eng., New Mexico State Univ., Las Cruces, NM, USA
  • Volume
    29
  • Issue
    24
  • fYear
    1993
  • Firstpage
    2101
  • Lastpage
    2103
  • Abstract
    A test method is presented for detecting defects and fabrication variations in both digital and analogue circuits by simultaneously pulsing the power supply rails and analysing the temporal and/or the spectral characteristics of the resulting transient rail currents. The presented method has a distinct advantage over other forms of iDD testing because it requires a single test vector to excite and expose the presence of a defect or fabrication variations.
  • Keywords
    VLSI; digital integrated circuits; integrated circuit testing; linear integrated circuits; spectral analysis; analogue ICs; defects detection; digital ICs; fabrication variations; i DD pulse response testing; power supply rails; single test vector; spectral characteristics; temporal characteristics; transient rail currents;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19931405
  • Filename
    247595
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=977627