Title :
Fundamentals of Infrared Detectors
Author :
Petritz, Richard L.
Author_Institution :
Texas Instruments Inc., Dallas, Texas
Keywords :
Absorption; Atomic measurements; Charge carrier processes; Germanium; Infrared detectors; Lattices; Photoconductivity; Photodetectors; Semiconductor impurities; Thermal resistance;
Journal_Title :
Proceedings of the IRE
DOI :
10.1109/JRPROC.1959.287036
