DocumentCode :
977908
Title :
Dependence of threshold current density, carrier lifetime and optical gain coefficient on donor concentration in 1.3 μm n-type modulation-doped strained multiquantum well lasers
Author :
Nakahara, Kouji ; Uomi, K. ; Tsuchiya, Takao ; Niwa, A.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo
Volume :
32
Issue :
13
fYear :
1996
fDate :
6/20/1996 12:00:00 AM
Firstpage :
1200
Lastpage :
1202
Abstract :
The dependence of lasing properties on the donor concentration is experimentally investigated for 1.3 μm n-type modulation-doped (MD) strained multiquantum well (MQW) lasers. The threshold current density has a minimum at a donor concentration of 3×1018 cm-3: the carrier lifetime and the optical gain coefficient decrease with the donor concentration. The turn-on delay time of 100 ps can be expected at 85°C when the MD-MQW structure is applied to a low-leakage buried heterostructure laser
Keywords :
carrier lifetime; doping profiles; leakage currents; optical interconnections; quantum well lasers; semiconductor doping; 1.3 micrometre; 100 ps; 85 degC; carrier lifetime; donor concentration; lasing properties; low-leakage buried heterostructure laser; n-type modulation-doped strained multiquantum well lasers; optical gain coefficient; threshold current density; turn-on delay time;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19960788
Filename :
503002
Link To Document :
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