Title :
Noise in Radiation Detectors
Author_Institution :
Res. Lab., Polaroid Corp., Cambridge, Mass.
Keywords :
Fluctuations; Frequency; Germanium; Infrared detectors; Iris; Noise level; Optimized production technology; Photoconductivity; Radiation detectors; Voltage;
Journal_Title :
Proceedings of the IRE
DOI :
10.1109/JRPROC.1959.287042
